T01000 - SEMI T10 - 二次元データマトリクス直接マーク品質を評価する試験方法 Revision:SEMI T10-0701 (Reapproved 0912) - Superseded ULSI and other devices have

ULSI and other devices have been increasingly miniaturized and integrated

SEMI E142-0224E (editorial revision)

storage or archiving of substrate maps

This Test Method utilizes the relationship between carbon concentration and the absorption coefficient of the infrared absorption band associated with substitutional carbon in silicon

It is based on the fundamental belief that specifications should facilitate the movement toward processed-in quality instead of inspected-in quality

T01000 - SEMI T10 - 二次元データマトリクス直接マーク品質を評価する試験方法 Revision:SEMI T10-0701 (Reapproved 0912) - Superseded ULSI and other devices haveglobal Traceability Technical Committee2012830global Audits and Reviews Subcommittee20129www. semiviews. org www. semi. org2001720073 , Referenced SEMI Standards None.