P00800 - SEMI P8 - Test Method for the Determination of Water in Photoresist Revision:SEMI P8-90 - Superseded SEMI MF28 — Test Method

SEMI MF28 — Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductive Decay

The purpose of this Document is to provide specification and guide for boron trichloride (BCl3) that are used in the semiconductor industry

微粒子の静電気吸着を低減することによる汚染管理では，領域の静電気のリスクは静電気の電荷の存在とレベルによって定義される。

SEMI S5-0616 (technical revision)

SEMI D21-1000 (technical revision)

P00800 - SEMI P8 - Test Method for the Determination of Water in Photoresist Revision:SEMI P8-90 - Superseded SEMI MF28 — Test MethodThis Standard was technically approved by the Micropatterning Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on September 12, 2011. Available at www. semiviews. org and www. semi. org in November 2011; originally published in 1984; previously published September 1997. NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status