G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Revision:SEMI G80-0200 - Superseded 4 This Specification defines a

4  This Specification defines a way for users to make ad hoc

SEMI MF391 — Test Method of Minority Carrier Diffusion Length in Extrinsic Semiconductors by Steady-State Surface Photovoltage

SEMI MF1725 — Practice for Analysis of Crystallographic Perfection of Silicon Ingots

which is biologically and ecologically very hazardous

The use of AFM for measuring the roughness of polymer surfaces is outlined in this test method

G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Revision:SEMI G80-0200 - Superseded 4 This Specification defines aNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This procedure will define a standard process whereby any logic integrated circuit (IC) automatic test equipment (ATE) system can be evaluated for parameters that makeup an alternating current (AC) timing accuracy