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Silk. Electronic test method for defects and evenness of raw silk Ingestion-build-64721 EN 12221-1:2008
Silk. Electronic test method for defects and evenness of raw silk Ingestion-build-64721 EN 12221-1:2008
$116.00
Description
EN 12221-1:2008
Why should you use BS EN 4250 - Nickel base alloys NI-B41001 for aerospace applications
Using BS 7020-7
It gives guidelines related to air cleanliness
• Heat cycle
Silk. Electronic test method for defects and evenness of raw silk Ingestion-build-64721 EN 12221-1:20081 Scope This International Standard specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers. This International Standard is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
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