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Corrosion of metals and alloys. Corrosion fatigue testing - Crack propagation testing using precracked specimens algolia-ignore This third edition cancels and

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This third edition cancels and replaces the second edition (ISO 225:1983)

The areic dose of the ion-implanted analyte retained in the WoRM wafer is certified against the areic dose of the same analyte retained in an ion-implanted silicon wafer having the status of a (preferably certified) secondary reference material (SeRM)

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BS EN 62416 specifies the hot carrier test method and test procedure of MOS transistors used in semiconductor devices

The principles of this standard can be applied to other fusion welding processes subject to agreement between the contracting parties

Corrosion of metals and alloys. Corrosion fatigue testing - Crack propagation testing using precracked specimens algolia-ignore This third edition cancels and

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